FePt/ Ta multilayer films were successf ully prepared by using direct current (DC) magnetronsputtering system. As for t he sample of [ FePt (2. 5 nm) / Ta (2. 5 nm) ]5annealed at 650℃,X2ray diff raction( XRD) result s show t he t ransition f rom atomic disorder to order. When t he t hickness of Ta layer is 2. 5 nm ,we obtained t he optimal magnetic properties. The coercivity is 543. 4 kA·m- 1, and t he squareness is0. 805 59. The nanograins dist ribute uniform , and t he FePt grain size is about 10～20 nm measured byatomic force microscope (AFM) . A large quantit y grains show conforming orientation observed by magneticforce microscope (M FM) . The reversal process of FePt t hin films has been investigated by measuring t heactivation volume and real grain volume. The rotation of t he magnetization is dominated in t he reversal pro2cess of FePt t hin film.